SEM Scanning Electron Microscope
The Scanning Electron Microscope with Energy Dispersive X-ray spectroscopy was recently installed in the University of Peradeniya and is housed at the New Geology building. The SEM is a sophisticated high end instrument and probably the only one of its kind in the country. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. SEMs have a variety of applications in a number of scientific and industry-related fields, especially where characterizations of solid materials is beneficial.
In addition to topographical, morphological and compositional information, a Scanning Electron Microscope can detect and analyse surface fractures, provide information in microstructures, examine surface contaminations, reveal spatial variations in chemical compositions, provide qualitative chemical analyses and identify crystalline structures. SEMs can be as essential research tool in fields such as life science, biology, geology, medical and forensic science, metallurgy. In addition, SEMs have practical industrial and technological applications such as semiconductor inspection, production line of miniscule products and assembly of microchips for computers.
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